This facility is intended to test optoelectronic instrumentation with an entrance pupil diameter of up to 500 mm under the combined exposure to thermal fields and vacuum.

This is intended for testing of large-scale optoelectronic instrumentation under exposure to thermal radiation while in a vacuum environment.

This is used for the energy calibration of deep-cooled optoelectronic instrumentation when simulating real background conditions (for entrance pupil diameters up to 300 mm).

This is used to investigate the combined influence of the outer space environment (hard vacuum, VUV and UV radiation, micrometeorites and fine particles) upon the elements and materials of the optoelectronic instrumentation.